Wednesday, 19 January 2011

Scanning Electron Microscope (SEM)


Finally after lots of huffs and puffs i have managed to coat few devices with Anti-reflection coating (silicon dioxide). Results from L-I measurements show some effects of the coating.

As the coating lowers reflectivity of the mirror facet, we expect the external differential efficiency to increase (this is interesting because one would expect other way round). Finally i can enjoy the SEM image showing the coating onto the facet of the edge emitting LASER.

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